Advanced Tools for Nanoscale Exploration
The ability to fabricate site-specific, customized 3D nanoprobes for Scanning Probe Microscopy (SPM) has the potential to redefine nanoscale imaging, localized spectroscopy, and advanced nano-manipulation. Apart from its ability to produce sharp apexes, it is the intgration of electric, thermal, optical, magnetic or even superconducting properties, which eliminates the need for additional functional coatings typically required for conventional SPM nanoprobes. Advantages include:
- Nano-Sharpness: sub-10 nm sharp nanoprobes provide exceptional spatial resolution for full compatibility with all measurement modes.
- Functional Nanoprobes: The material versatility of FEBID and FIBID allows access to advanced AFM modes, such as CAFM, KFM, EFM, MFM, SThM, TERS or SNOM. These custom probes often surpass commercially available alternatives due to their all-functional material qualities with ultra-sharp apexes.
- Multi-Functional Probes: Both FEBID and FIBID enable the integration of multiple functionalities, such as MFM and CAFM, into a single tip. This innovation eliminates frequent probe exchanges, significantly advancing correlated microscopy by enabling simultaneous multi-modal measurements beyond traditional possibilities.
- Design Flexibility: offered by FEBID and FIBID, designs extend far beyond single-tip geometries, as demonstrated by advanced concepts such as freestanding 3D thermistor designs for Scanning Thermal Microscopy (SThM).
These capabilities push the boundaries of SPM, delivering tools that are both highly adaptable and technologically superior.hat not only address existing challenges but also set the stage for the next generation of magnetic, optical or photonic innovations.
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